Introduction Tech workplaces are changing fast, thanks to new AI tools, data-driven workflows, and innovations in cleanroom processes. As we learn to balance human creativity with machine precision, companies have to adapt to keep up. This article explores how next-generation tools in areas like semiconductor metrology and automation are changing how we get work…

Author: Lex S. I’m a senior semiconductor R&D specialist with over 25 years in analytical instrumentation, process development, and reverse engineering. I work with SEM, FIB, AFM, EDX, reflectometry, and broad ion milling to uncover failure mechanisms and turn those findings into better, more reliable processes. Introduction Tech workplaces are changing fast, thanks to…

Author: Lex S. I’m a senior semiconductor R&D specialist with over 25 years in the trenches of analytical instrumentation, process development, and reverse engineering. My work involves using a whole suite of tools—from SEM, FIB, and AFM to EDX, reflectometry, and broad ion milling—to pinpoint failure mechanisms and translate those findings into more robust…

Author: Lex S. I’m a senior semiconductor R&D specialist with 25+ years in analytical instrumentation, process development, and reverse engineering—working across SEM, FIB, AFM, EDX, reflectometry, and broad ion milling to uncover failure mechanisms and turn findings into better processes. Introduction Identifying performance-limiting defects in modern semiconductors requires a toolkit of advanced diagnostic methods.…

Author: Lex S. I’m a senior semiconductor R&D specialist with over 25 years in analytical instrumentation, process development, and reverse engineering. My work involves using tools like SEM, FIB, AFM, EDX, reflectometry, and broad ion milling to find the root cause of failures and use those insights to improve manufacturing processes. Introduction The semiconductor…

Author Lex S.I’m a senior semiconductor R&D specialist with over 25 years in analytical instrumentation and process development. My work involves developing and modifying instruments like SEM, FIB, AFM, and EDX, as well as techniques like reflectometry and Broad Ion Milling. Optical sensors and imaging systems are evolving fast, becoming essential in fields like…