metrology

  • From Sand to Silicon – A Journey Through Semiconductor Fabrication

    From Sand to Silicon – A Journey Through Semiconductor Fabrication

    Modern electronics begin with something as simple as sand. Through intricate and highly controlled processes, that sand transforms into sophisticated semiconductor devices that power everything from smartphones to satellites. This article explores how raw silicon becomes a microchip, emphasizing precision, cleanroom environments, and the critical role of optical measurement in quality assurance. The Birth…

  • Pushing Boundaries with New Materials for Next-Generation Transistors

    Pushing Boundaries with New Materials for Next-Generation Transistors

    The quest for smaller, faster, and more energy-efficient transistors is driving a revolution in materials science. From 2D materials to high-mobility semiconductors, innovative compounds are emerging as key ingredients in next-gen devices. This article explores how these materials are influencing transistor design and how metrology tools help characterize and control their properties with precision.…

  • Beyond Silicon – Exploring the Future of Semiconductors with New Materials and Technologies

    Beyond Silicon – Exploring the Future of Semiconductors with New Materials and Technologies

    As the semiconductor industry pushes the limits of silicon, emerging materials and novel technologies are taking center stage. These innovations seek to address current challenges in performance, scalability, and energy efficiency. In this article, we explore the materials and metrology tools reshaping the semiconductor landscape and how they are paving the way for future…

  • The Semiconductor Cold War: US vs. China in Technology Supremacy

    The Semiconductor Cold War: US vs. China in Technology Supremacy

    The competition between the US and China has reached unprecedented levels, particularly in the semiconductor industry. As nations vie for technological superiority, the importance of precision metrology, thin film analysis, and advanced optical measurement technologies such as WLRS technology becomes crucial. This article delves into the impacts of this rivalry and the role of…